Showing results: 211 - 225 of 400 items found.
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LS Series -
Unholtz-Dickie Corporation
The LS Series Long Stroke Thruster Test Systems are highly regarded as the industry standard for long stroke transient testing. This equipment is used in the design and production test of automotive airbag sensors by leading suppliers of automotive airbags and associative control modules.
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The Test Connection, Inc.
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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TestMaster -
S.E.A. Datentechnik GmbH
TestMaster is a reliable tool for test systems, test beds, or production facilities in industrial enviroments and a flexible tool in the hands of the engineer, scientist, or plant operator. Like an advanced operating system, its individual modules provide straightforward solutions to diverse measuring and testing tasks. test management, test verification, sequence control, hardware abstraction, process data management proceess data distribution and visualization.
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NEOSEM TECHNOLOGY INC
The Neosem’s SSD test system combines advanced SSDtest hardware, software and environmental chamber into a single platform and supports all popular storage interfaces including PCIe, SAS & SATA and fast emerging protocols such as NVMe and AHCI. The SSD test system of Neosem is available ranging from desktop sized desktop sizedconfigurations for engineering use to manufcturing scale test systems for mass production with multiple burn-in chambers.
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SignalCraft Technologies Inc.
PXI-based modules form the core of many measurement and automation systems. These modules are designed to integrate into design verification and high-volume production test systems. Combined with our demonstrated microwave and high-speed digital expertise, SCT’s PXI design capabilities make us well positioned to deliver innovative products to the wireless test market.
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Imapact 7BT -
Lorlin Test Systems
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface.
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Griffin III -
Hilevel Technology, Inc.
The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
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Brymen Technology Corporation
Insulation Multimeter is a new category of test tool that combines a full featured True-rms DMM and a megohmme- ter. It's an integrated tool for maintaining and troubleshooting motor systems, electrical distribu- tion, and production equipment.
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RedViking
Customers in automotive and off-highway vehicle production and R&D environments trust us to design and build precise, reliable, and repeatable drivetrain component test stands. All of our systems are designed to provide the highest level of dynamic testing capability at a competitive price. For decades, RedViking has designed, built, and implemented highly engineered test systems for drivetrain systems and components.
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UF3000EX-e -
CSE Co.,Ltd
Wafer Probe Station is used in connection with test system in Wafer Test process.It is a device to move wafer automatically to examine fair quality of individual chip on the wafer. Probe Station is seperated depending on purpose. For analysis, for mass production as well as manual, semi-automatic, full-automatic.
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M300 -
Rigol Technologies Inc.
No matter the product performance test in the R & D stage or the automatic test in the production process, for the application of multiple test points and multiple signal measurement, the M300 series data acquisition / switch system with modular structure combines the precise measurement function with the flexible signal connection function, and can provide a wealth of test measurement solutions.
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LSCM -
OptCom Company, Ltd
This device performs high-speed measurement and sorting of LED electrical and optical characteristics while synched with control signals from the LED production line inspection and sorting system. The LSCM then provides that pass/fail information to the system. The LSCM is equipped with the function to test both electrical and optical characteristics by applied voltage and current to the LED. This test device was designed to integrate test functions required by the inspection and sorting system into one compact body.
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Signalysis, Inc.
Signalysis has worked with many Tier I and Tier II Automotive sub-suppliers to provide production test systems. Below are some examples of our systems; we have also supplied systems for wiper motors, axles, door panels, window mechanisms, and many other interior components.
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S.E.A. Datentechnik GmbH
The P480-1000 battery test system is a scalable high-performance test system consisting of a central power unit with power supply units and electronic loads and up to four mobile test stations. The test stations contain the necessary measuring technology and the PC terminal with touch screen for operating the test bench. The modular concept, the common use of power supply units and loads as well as the regenerative capability of the loads enables an extremely cost-efficient operation of the entire test system both in the development and production of battery systems. The required power is switched to the respective test station via a specially developed high-performance switching matrix
